The last results of IPVF about amorphous alumina modelling, were recently published in The Journal of Physical Chemistry Letters.

These findings, available here http://pubs.acs.org/doi/full/10.1021/acs.jpclett.7b00896 ,  are very interesting for the photonics and electronics community, as they shed light on the modification of the properties of alumina due to defect, especially interesting for low temperature thin films where such kind of defects can be easily introduced.