Maximum Sample Size: 30×30 cm2
Maximum Sample Height: 5 cm
All types of materials
Manufacturer: FISCHER
Model: XDV-SDD series
Tool can be used by everybody providing a short training
X-Ray Fluorescence (XRF) gives information on the composition of a sample through the analysis of the spectral emission of the material when it is excited by an X-Ray beam. Both qualitative and quantitative (mass concentration) analysis are available.
When a material is under a high energy beam (e.g. illuminated with X-Rays), atoms in the structure are subject to ionization. Once excited, the material then relax and electrons in higher energy states will return to their initial electrical state (shell) through atomic electrical transitions that are specific to the element. By returning in stable state, the excess energy is transferred to an X-photon. Thus the analysis of the X reemitted spectrum is determined by the elemental composition of the layer. Specific compounds may also feature specific electronic transitions that may be revealed through XRF.
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