Maximum Sample Size: 20×20 cm2
Maximum Sample Height: 2 cm
Surface and cross-section measurements possible
Conductors and semi-conductors (KPFM & Resiscope)
Manufacturer: Agilent (AFM, KPFM) / Scientec (Resiscope)
Model: PicoScan 3000 / PicoScan 5500
Minimum training time to use the machine: AFM (short training) / KPFM (Measurements done by researcher or thoroughly trained operator. Acquired data required expert intervention for interpretation)
AFM: topograph and roughness at nanoscale. Qualitative mechanical properties (soft, hard…)
KPFM: Work function at nanoscale.
Resiscope: Current and resistance at nanoscale.
AFM: tapping mode (non-destructive), contact mode (may cause indentation)
KPFM: measurement of work function in AFM tapping mode by monitoring the cantilever amplitude at the first harmonic of the applied voltage bias (not destructive).
Resiscope: measurement of current and resistivity in AFM contact mode when a voltage bias is applied between the tip and the sample. Resiscope is an advanced conducting probe AFM technique (CP-AFM) (may cause indentation).
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