Maximum Sample Size: 20×20 cm²
Maximum Sample Height: 10 cm
Minimum training time to use the machine: 1 day
Profilometer provides different measurements:
The DektakXT can perform the critical nanometer-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets
Stylus profilometer use a probe to detect the surface and physically moving a probe along the surface in order to mechanically acquire the surface height or roughness
Feel free to contact us for more information about our offers.