XPS - THERMOSCIENTIFIC • IPVF - L’Institut Photovoltaïque d’Île-de-France

What is it for?

XPS spectrometers provide elemental and chemical information of various materials (solids, powders, polymers, etc.) with a lateral resolution of 10 to 600 μm and a depth of analysis less than 10 nm.

Higher depths can be reached by profiling using ionic abrasion (mono or polyatomic). Angular analysis is also possible. Flood gun compensation allows the study of conductive but also insulating materials. Various materials (solids, powders, polymers, etc.) with a lateral resolution of 10 to 600 μm and a depth of analysis of less than 10 nm.

How does it work?

Spectra are obtained by irradiating a solid surface with a X-rays beam while simultaneously measuring the kinetic energy of electrons that are emitted from the top 1-10 nm of the material being analyzed. A spectrum is recorded by counting ejected electrons over a range of electron kinetic energies. The energies and intensities of the photoelectron peaks enable identification and quantification of all surface elements (except hydrogen).

XPS – THERMOSCIENTIFIC

Key sample information

All types of materials

Practical information

What is it for?

How does it work?

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L’Institut Photovoltaïque d’Île-de-France (IPVF)

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