Spectroscopic ellipsometer – HORIBA

Characterization

Compo/Morpho

microPCD – SEMILAB

Characterization

Opto-Electronic

PECVD – MVS

Processing

Vacuum-based

PECVD – INDEOTEC

Processing

Vacuum-based

Lifetime tester – SINTON

Characterization

Opto-Electronic

TR-FLIM

Characterization

Compo/Morpho

Hall Effect – ECOPIA

Characterization

Opto-Electronic

Optical benches – IPVF

Fabrication / Integration

Opto-Electronic

Screen Printer – ASYS EKRA

Fabrication / Integration

Processing

Mechanical Scribing – CIELLE

Fabrication / Integration

Processing

Potential Induced Degradation – FREIBERG INST.

Characterization

Opto-Electronic

Photocurrent spectroscopy – FTPS

Characterization

Opto-Electronic

Climate Chamber – ASLI

Characterization

Opto-Electronic

Climate Chamber – WEISSTECH

Characterization

Opto-Electronic

Hyperspectral – Photon etc.

Fabrication / Integration

Opto-Electronic

Confocal Microscopy – OLYMPUS

Characterization

Compo/Morpho

Profilometer – BRUKER

Characterization

Compo/Morpho

Co-Evaporation – MBE KOMPONENTEN

Processing

Vacuum-based

Sputtering – PLASSYS

Processing

Vacuum-based

MBE – RIBER

Processing

Vacuum-based

Evaporator – PLASSYS

Processing

Vacuum-based

IQE – NEWPORT

Characterization

Opto-Electronic

Solar Simulator – NEWPORT

Characterization

Opto-Electronic

Spectroscopy UV/Vis/NIR – AGILENT

Opto-Electronic

AFM / KPFM / Resiscope Setup

Characterization

Compo/Morpho

XRF – FISCHER

Characterization

Compo/Morpho

ALD

Processing

Vacuum-based

Laser Scribing – INNOLAS

Fabrication / Integration

Processing

Raman – HORIBA

Characterization

Compo/Morpho

XPS – THERMOSCIENTIFIC

Characterization

Compo/Morpho